7月7日～8日にオンラインで開催される2022 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD 2022)にて、岡本准教授が下記の招待講演を行います。
Dai Okamoto, Mitsuru Sometani, Hirohisa Hirai, Mitsuo Okamoto, Tetsuo Hatakeyama
“Understanding Negative Bias Temperature Instability in 4H-SiC MOSFETs by Fast Threshold Voltage Measurements”
2022 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD 2022) 2022年7月8日